Climber_bannerad_300x250_15s

Want your profile here?

Becoming a member is easy!

Climber.com works with you to help you advance your career by putting you directly in front of tens of thousands of recruiters in your field. Just fill out the form below to start your account.

Sign up today!



Jobs_start_here

Recruiters - Try Postings!

Postings.com™ is a must-have for recruiters who want to:

  • Find Qualified Candidates
  • Find Job orders and Post Splits
  • Be Found in Search Engines
  • Implement a Social Sourcing Strategy

Rssresearch or analysis of semiconductor materials or engineering materials

SEM / FIB lab engineer strong in verifying and isolating semiconductor device failures and physical analysis to determine the root cause of failure. Proven experience in fault isolation, physical / construction analysis, identifying failure mechanisms, characterizing manufacturing defects and new semiconductor materials. Areas of expertise include: Failure Analysis FA Defect Characterization IC Failure Mechanisms SEM / FIB Lab Equipment Failure isolation technique Element Identification Semiconductor Processing Construction Analysis Patent Infringement Deprocess / delayer IC Semiconductor etches Chemistry

Laboratory

Tempe, AZ

About Me

Work Experiences

6/1984 - Present

(private)

Individual Contributor

  • • Identified poly stringers on Atlas Ultralight chip-set for automotive applications achieving a 30% yield improvement saving Freescale $100M in 1 year. The failure sites were pinpointed using PEM (Photo Emission Microscopy). • Improved SMOS8 lot yields 25% by discovering tungsten particles from wafer-edge arching causing metal shorts. The failures were isolated using XIVA (Externally Induced Voltage Alteration). • Enabled the MIM (Metal-Insulator-Metal) capacitor team to meet customer qualification date by determining the cause for short lifetime reliability samples were due to shorts from metal veils. Failures pinpointed with IR (Infrared Imaging). • Reduced equipment downtime 20% by troubleshooting malfunctions. Responsible for SEM / FIB (Scanning Electron Microscope / Focused Ion Beam) and sample preparation equipment maintenance, performance, and training. • Performed physical characterization using light microscopes, SEM, FIB, EDS / WDS (Energy / Wavelength Dispersive Spectroscopy), AES (Auger Electron Spectroscopy), and sample preparation equipment.

Education

Keywords